PAT Systems
Applications of the PAT systems
In-situ process control
Particle size distribution of suspensions
Dynamic distribution of disperse phase systems in high concentration
Measurement of dry materials such as powder and granules
ORM Technology
basis of ORM Technology
The in-situ PAT sensors work on the basis of the patented ORM (Optical Back Reflection Measurement) technology with the ToF (Time of Flight) method. A laser beam is moved over a stream of particles. From the time span which is required to sweep over the focused particles, their size is determined.
Depending on the application, the focus movement is fixed, linear or linear and rotating, but also
rotating with autofocus.
The unique dynamic focusing allows a large dynamic measuring range from 0.5 to 2000 µm.
Artifacts and agglomerates can be removed using the Ultrasonic dispersion to capture, more…
Request the Sequip data sheet PAT sensor
Inquiry form for a customer-specific configuration of the PAT sensor system
The more detailed we know the application, the more precisely and cost-effectively we can configure your measuring system.
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PAT Sensor
Modular configuration options
The modular configuration of all components has the advantage that the Sequip systems are equipped customer-specifically and are therefore precisely tailored for every possible application.
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