PAT Systems

Applications of the PAT systems

In-situ process control

Particle size distribution of suspensions

Dynamic distribution of disperse phase systems in high concentration

Measurement of dry materials such as powder and granules

ORM Technology

basis of ORM Technology

The in-situ PAT sensors work on the basis of the patented ORM (Optical Back Reflection Measurement) technology with the ToF (Time of Flight) method. A laser beam is moved over a stream of particles. From the time span which is required to sweep over the focused particles, their size is determined.

Depending on the application, the focus movement is fixed, linear or linear and rotating, but also 

rotating with autofocus.

The unique dynamic focusing allows a large dynamic measuring range from 0.5 to 2000 µm.

Artifacts and agglomerates can be removed using the  Ultrasonic dispersion to capture,  more…

Request the Sequip data sheet PAT sensor

Inquiry form for a customer-specific configuration of the PAT sensor system

The more detailed we know the application, the more precisely and cost-effectively we can configure your measuring system.

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PAT Sensor

Modular configuration options

The modular configuration of all components has the advantage that the Sequip systems are equipped customer-specifically and are therefore precisely tailored for every possible application.


Application reports with the PAT sensor systems

Inline analysis of drilling mud and slurry

Inline measurement of cement

Control of the grinding process for powders

Precipitation analysis of potato starches

Examination of ice cream

Partikelanalyse bei kryogenen Prozessen